High-frequency dielectric measurements

IEEE Instrumentation and Measurement Magazine

Volumn 13, Issue 2, 2010, Pages 24-31

  Baker Jarvis, James ^a   Janezic, Michael D ^b   Degroot, Donald C ^c  

^a Electromagnetic Advanced Materials Project   (Germany)

^b UNIVERSITY OF COLORADO   (United States)

^c NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BROAD BANDS; DEVELOPMENT ACTIVITY; ELECTRONIC PRODUCT; EM FIELD; GUIDED WAVE STRUCTURES; HIGH FREQUENCY HF; HIGH-FREQUENCY DIELECTRICS; LONG DISTANCES; LOW-FREQUENCY SIGNALS; MATERIAL PARAMETER; RADIO FREQUENCIES; SCIENTIFIC EXPLORATION; TERAHERTZ FREQUENCIES;

ELECTROMAGNETIC WAVES; ELECTRONICS INDUSTRY;

PRODUCT DEVELOPMENT;

EID: 77950360838     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2010.5438334     Document Type: Article

References (5)

1. NIST Technical Notes no.1341 (1990), no. 1355 (1993) and no. 1536 (2005). [Online] Available: http://www.nist.gov/ eeel/electromagnetics/rf-electronics/ advanced-materials- publications.cfm.
2. R. N. Clarke, "Good Practice Guide on RF and microwave dielectric measurements," National Physical Laboratory, UK, 2003.
3. Methods for PCB Measurements. [Online] Available: http:// www.PCBmeasurements.com/measurementselector.html.
4. M. D. Janezic and J. A. Jargon, "Complex permittivity determination from propagation constant measurements", IEEE Microwave and Guided Wave letters, Vol.9, pp. 76-78, 1999.
5. M. D. Janezic and J. Baker-Jarvis, "Full-wave analysis of a split cylinder resonator for nondestructive permittivity measurements", Microwave Theory Techniques, vol.47, pp. 2014-2020, 1999.