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Volumn 195, Issue 15, 2010, Pages 4928-4934
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Open circuit voltage profiling as diagnostic tool during stack lifetime testing
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Author keywords
Current mapping; Diagnostic tools; Fuel cells; OCV
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Indexed keywords
CURRENT MAPPING;
DIAGNOSTIC TOOLS;
DRIVE CYCLES;
LIFETIME TESTING;
MINIMALLY INVASIVE;
POLARIZATION CURVES;
PROFILE MEASUREMENT;
REACTANT GAS;
SYSTEMATIC VARIATION;
DIAGNOSTIC PRODUCTS;
FUEL CELLS;
LEAKAGE (FLUID);
OPEN CIRCUIT VOLTAGE;
MAPPING;
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EID: 77950300000
PISSN: 03787753
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpowsour.2009.12.061 Document Type: Article |
Times cited : (19)
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References (13)
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