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Volumn 195, Issue 15, 2010, Pages 4928-4934

Open circuit voltage profiling as diagnostic tool during stack lifetime testing

Author keywords

Current mapping; Diagnostic tools; Fuel cells; OCV

Indexed keywords

CURRENT MAPPING; DIAGNOSTIC TOOLS; DRIVE CYCLES; LIFETIME TESTING; MINIMALLY INVASIVE; POLARIZATION CURVES; PROFILE MEASUREMENT; REACTANT GAS; SYSTEMATIC VARIATION;

EID: 77950300000     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2009.12.061     Document Type: Article
Times cited : (19)

References (13)
  • 6
    • 35748941340 scopus 로고    scopus 로고
    • Borup R., et al. Chem. Rev. 107 (2007) 3904
    • (2007) Chem. Rev. , vol.107 , pp. 3904
    • Borup, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.