Submicron rectangular hollow tube crystals of rutile-type GeO2

Journal of Crystal Growth

Volumn 312, Issue 10, 2010, Pages 1731-1735

  Niwa, K ^a   Ikegaya, H ^a   Hasegawa, M ^a   Ohsuna, T ^b   Yagi, T ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b Rd Management Section   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

A1. Crystal morphology; A2. Growth from high temperature solutions; A2. Single crystal growth; B1. Oxides

Indexed keywords

A2. GROWTH FROM HIGH TEMPERATURE SOLUTIONS; A2. SINGLE CRYSTAL GROWTH; CROSS SECTION; CRYSTAL GROWTH MECHANISM; CRYSTAL MORPHOLOGIES; GROWTH FROM HIGH-TEMPERATURE SOLUTIONS; GROWTH MECHANISMS; HOLLOW TUBE; SUBMICRON; SUBMICRON SIZE; SUPER-CRITICAL; TIO; WALL THICKNESS;

CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLIZATION; GRAIN BOUNDARIES; MORPHOLOGY; OXIDE MINERALS; OXYGEN; TUBES (COMPONENTS);

SINGLE CRYSTALS;

EID: 77950188258     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.02.006     Document Type: Article

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