메뉴 건너뛰기




Volumn 60, Issue 5-6, 2003, Pages 127-133

Accuracy and sensitivity of surface resistance measurements of high-temperature superconductor films using quasioptical dielectric resonators

Author keywords

[No Author keywords available]

Indexed keywords


EID: 77950010181     PISSN: 00402508     EISSN: None     Source Type: Journal    
DOI: 10.1615/TelecomRadEng.v60.i56.150     Document Type: Article
Times cited : (17)

References (10)
  • 1
    • 0347522101 scopus 로고    scopus 로고
    • Microwave applications of high temperature superconductors
    • Greed R.B., Hunt B.D., Jeffries R.F., and Voyce D.C. Microwave Applications of High Temperature Superconductors // GEC Review. -1999. -Vol. 14, N 2. - P.103-114.
    • (1999) GEC Review , vol.14 , Issue.2 , pp. 103-114
    • Greed, R.B.1    Hunt, B.D.2    Jeffries, R.F.3    Voyce, D.C.4
  • 3
    • 0035704554 scopus 로고    scopus 로고
    • Sensitivity of Rs-measurement of HTS thin films by three prime resonant techniques: Cavity resonator, dielectric resonator, and microstrip resonator
    • Misra M., Kataria N.D., Pinto R., Tonouchi M., and Srivastava G.P. Sensitivity of Rs-Measurement of HTS Thin Films by Three Prime Resonant Techniques: Cavity resonator, Dielectric resonator, and Microstrip resonator // IEEE Trans. Appl. Superconduct. - 2001. -Vol. 11, N 4. - P.4128-4135.
    • (2001) IEEE Trans. Appl. Superconduct , vol.11 , Issue.4 , pp. 4128-4135
    • Misra, M.1    Kataria, N.D.2    Pinto, R.3    Tonouchi, M.4    Srivastava, G.P.5
  • 4
    • 0035704636 scopus 로고    scopus 로고
    • Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonator (Corrected)
    • Mazierska J. and Wilker Ch. Accuracy Issues in Surface Resistance Measurements of High Temperature Superconductors using Dielectric Resonator (Corrected) // IEEE Trans. Appl. Superconduct. -2001.-Vol. 11,N4.-P.4140-4147.
    • (2001) IEEE Trans. Appl. Superconduct , vol.11 , Issue.4 , pp. 4140-4147
    • Mazierska, J.1    Wilker, Ch.2
  • 7
  • 8
    • 0033359335 scopus 로고    scopus 로고
    • Use of whispering-gallery modes for complex permittivity determinations of ultra-low-loss dielectric materials
    • Krupka J., Derzakowski K., Abramowicz A., Tobar M.E., and Geyer R.G. Use of Whispering-gallery Modes for Complex Permittivity Determinations of Ultra-Low-Loss Dielectric Materials // IEEE Trans. Microwave Theory Thech. - 1999. -Vol. 47, No 6. - P.752-758.
    • (1999) IEEE Trans. Microwave Theory Thech. , vol.47 , Issue.6 , pp. 752-758
    • Krupka, J.1    Derzakowski, K.2    Abramowicz, A.3    Tobar, M.E.4    Geyer, R.G.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.