Fault detection and diagnosis of chemical process based on an improved multi-scale KPCA

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 31, Issue 1, 2010, Pages 51-55

  Xu, Jie ^a,b   Hu, Shousong ^a   Shen, Zhongyu ^b  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

^b NANJING NORMAL UNIVERSITY   (China)

Author keywords

Contribution plot; Fault detection; Fault diagnosis; Feature vector selection; Kernel principal component analysis; Wavelet transform

Indexed keywords

CONTRIBUTION PLOT; CONTRIBUTION PLOTS; FAULT DIAGNOSIS; FEATURE VECTOR SELECTION; KERNEL PRINCIPAL COMPONENT ANALYSIS;

CHEMICAL DETECTION; FAILURE ANALYSIS; FAULT DETECTION; PROCESS MONITORING; WAVELET TRANSFORMS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 77949890140     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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