MSPA based on process information denoised with wavelet transform and its application to chemical process monitoring

Huagong Xuebao/Journal of Chemical Industry and Engineering (China)

Volumn 54, Issue 10, 2003, Pages 1478-1481

  Chen, Guojin ^a   Liang, Jun ^a   Qian, Jixin ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Blind signal analysis; Multivariate statistical projection analysis; Process monitoring; Wavelet transform

Indexed keywords

CHEMICAL ENGINEERING; MONITORING; SIGNAL PROCESSING; STATISTICAL PROCESS CONTROL;

BLIND SIGNAL ANALYSIS; CHEMICAL PROCESS; DENOISE; MULTIVARIATE STATISTICAL PROCESS CONTROL; MULTIVARIATE STATISTICAL PROJECTION ANALYSIS; PROCESS MONITORING;

WAVELET TRANSFORMS;

EID: 0442310782     PISSN: 04381157     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. Bashi B R. Multiscale PCA with Application to Multivariate Statistical Process Monitoring. AIChE J., 1998, 44(7): 1596-1610
2. Donoho D L, Johnstone I M. Threshold Selection for Wavelet Shrinkage of Noisy Data. In: Proceedings of the 16th Annual International Conference Engineering in Medicine and Biology Society, 1994. Vol.1. A24-A25
3. Hyvarinen A, Oja E. Independent Component Analysis: Algorithms and Applications. Neural Networks, 2002, 13: 411-430
4. Jackson J E, Mudhalkar G S. Control Procedures for Residuals Associated with Principal Component Analysis. Technometrics, 1979, 21: 341-349
5. Silebi C A, Schiesser W E. Dynamic Modeling of Transport Process Systems. San Diego, California: Academic Press, 1992