Wide-band capacitance measurement on a semiconductor double quantum dot for studying tunneling dynamics

Applied Physics Letters

Volumn 96, Issue 3, 2010, Pages

  Ota, Takeshi ^a   Hayashi, Toshiaki ^a   Muraki, Koji ^a   Fujisawa, Toshimasa ^a,b  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DETECTORS; DOUBLE QUANTUM DOTS; FREQUENCY DEPENDENCE; INTERDOT TUNNEL COUPLING; QUANTUM CAPACITANCE; QUANTUM MECHANICAL; SINGLE ELECTRON; TUNABLE HIGH-FREQUENCY; TUNNELING DYNAMICS; TUNNELING RATES; WIDE FREQUENCY RANGE; WIDE-BAND;

CAPACITANCE; CAPACITANCE MEASUREMENT; CURRENT VOLTAGE CHARACTERISTICS; TUNNELING (EXCAVATION); WIND TUNNELS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 77949835079     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3285180     Document Type: Article

References (12)

1. M. Field, C. G. Smith, M. Pepper, D. A. Ritchie, J. E. F. Frost, G. A. C. Jones, and D. G. Hasko, Phys. Rev. Lett. PRLTAO 0031-9007 70, 1311 (1993). 10.1103/PhysRevLett.70.1311
2. T. Fujisawa, T. Hayashi, R. Tomita, and Y. Hirayama, Science SCIEAS 0036-8075 312, 1634 (2006). 10.1126/science.1126788 (Pubitemid 43902658)
3. C. Barthel, D. J. Reilly, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Phys. Rev. Lett. PRLTAO 0031-9007 103, 160503 (2009). 10.1103/PhysRevLett.103. 160503
4. W. G. van der Wiel, S. De Franceschi, J. M. Elzerman, T. Fujisawa, S. Tarucha, and L. P. Kouwenhoven, Rev. Mod. Phys. RMPHAT 0034-6861 75, 1 (2003). 10.1103/RevModPhys.75.1 (Pubitemid 36549937)
5. R. C. Ashoori, H. L. Stormer, J. S. Weiner, L. N. Pfeiffer, K. W. Baldwin, and K. W. West, Phys. Rev. Lett. PRLTAO 0031-9007 71, 613 (1993). 10.1103/PhysRevLett.71.613
6. T. Duty, G. Johansson, K. Bladh, D. Gunnarsson, C. Wilson, and P. Delsing, Phys. Rev. Lett. PRLTAO 0031-9007 95, 206807 (2005). 10.1103/PhysRevLett.95.206807
7. S. Ilani, L. A. K. Donev, M. Kindermann, and P. L. McEuen, Nat. Phys. ZZZZZZ 1745-2473 2, 687 (2006). 10.1038/nphys412
8. H. D. Cheong, T. Fujisawa, T. Hayashi, and Y. Hirayama, Appl. Phys. Lett. APPLAB 0003-6951 81, 3257 (2002). 10.1063/1.1515883 (Pubitemid 35360556)
9. Separate measurements checking the response to different gates (data not shown) confirm that the peak marked with an asterisk comes from another, unintentionally formed, local potential minimum.
10. T. Hayashi, T. Fujisawa, R. Tomita, and Y. Hirayama, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 45, 3629 (2006). 10.1143/JJAP.45.3629 (Pubitemid 43841109)
11. L. DiCarlo, H. J. Lynch, A. C. Johnson, L. I. Childress, K. Crockett, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Phys. Rev. Lett. PRLTAO 0031-9007 92, 226801 (2004). 10.1103/PhysRevLett.92.226801
12. J. R. Petta, A. C. Johnson, J. M. Taylor, E. A. Laird, A. Yacoby, M. D. Lukin, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Science SCIEAS 0036-8075 309, 2180 (2005). 10.1126/science.1116955 (Pubitemid 41396061)