Grain contrast imaging in FIB and SEM

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Canovic, S ^a   Jonsson, T ^a   Halvarsson, M ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649087175     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012054     Document Type: Article

References (3)

1. Goldstein J et al 2003 (Plenum Press, New York)
2. Vermeulen J P 2005 A Novel STEM Detector System Imaging Microscopy 1 22-23
3. Phaneuf M W 1999 Micron 30 277-288