Modeling of the scanning surface plasmon microscope

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 27, Issue 3, 2010, Pages 450-457

  Elezgaray, Juan ^a   Roland, Thibault ^a,b   Berguiga, Lotfi ^a,b   Argoul, Françoise ^a,b  

^a CNRS   (France)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; NANOPARTICLES; PLASMONS;

DEFOCUS; EXACT SOLUTION; GOLD LAYER; HIGH SENSITIVITY; IMAGE CONTRASTS; IMAGING PROCESS; MAXWELL'S EQUATIONS; SPATIAL RESOLUTION; SPHERICAL NANOPARTICLES; SUB-WAVELENGTH; SURFACE PLASMONS;

MAXWELL EQUATIONS;

EID: 77949544300     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.27.000450     Document Type: Article

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