High-resolution surface-plasmon imaging in air and in water: V(z) curve and operating conditions

Optics Letters

Volumn 32, Issue 5, 2007, Pages 509-511

  Berguiga, Lotfi ^a   Zhang, Sanjun ^a   Argoul, Françoise ^a   Elezgaray, Juan ^b  

^a UNIVERSITÉ DE LYON   (France)

^b INSTITUT EUROPÉEN DE CHIMIE ET BIOLOGIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION EFFECTS; LASER BEAM DIAMETER; OPERATING MODES; SURFACE PLASMON PROPAGATION;

ELECTROMAGNETIC WAVE DIFFRACTION; IMAGE RESOLUTION; LASER BEAMS; LIGHT PROPAGATION; OPTICAL MICROSCOPY;

IMAGING SYSTEMS;

SILICON DIOXIDE; WATER;

AIR; ARTICLE; CHEMISTRY; INSTRUMENTATION; LASER; METHODOLOGY; NORMAL DISTRIBUTION; OSCILLOMETRY; RADIATION SCATTERING; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; THEORETICAL MODEL;

AIR; LASERS; MODELS, THEORETICAL; NORMAL DISTRIBUTION; OSCILLOMETRY; SCATTERING, RADIATION; SILICON DIOXIDE; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES; WATER;

EID: 33847612945     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.32.000509     Document Type: Article

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