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Volumn 58, Issue 8, 2010, Pages 3050-3058
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Critical properties of symmetric nanoscale metal-ferroelectric-metal capacitors
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Author keywords
Critical thickness; Curie temperature; Ferroelectric; Stability analysis
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Indexed keywords
AMBIENT TEMPERATURES;
ANALYTIC EXPRESSIONS;
CHARGE COMPENSATION;
CRITICAL PROPERTIES;
CRITICAL THICKNESS;
DEPOLARIZATION FIELDS;
ELECTRODE INTERFACE;
FERROELECTRIC CAPACITORS;
INTERFACES AND SURFACES;
METAL CAPACITORS;
MISFIT STRAINS;
NANO SCALE;
NANOSCALE METALS;
NEAR-SURFACE;
SPONTANEOUS POLARIZATIONS;
STABILITY ANALYSIS;
SURFACE AND INTERFACES;
SURFACES AND INTERFACES;
THERMODYNAMIC MODEL;
TRAJECTORY-BASED;
CAPACITANCE;
CAPACITORS;
CURIE TEMPERATURE;
DEPOLARIZATION;
ELECTRIC FIELDS;
METAL ANALYSIS;
NANOSTRUCTURED MATERIALS;
FERROELECTRICITY;
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EID: 77949539858
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.01.039 Document Type: Article |
Times cited : (29)
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References (50)
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