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Volumn 58, Issue 8, 2010, Pages 3050-3058

Critical properties of symmetric nanoscale metal-ferroelectric-metal capacitors

Author keywords

Critical thickness; Curie temperature; Ferroelectric; Stability analysis

Indexed keywords

AMBIENT TEMPERATURES; ANALYTIC EXPRESSIONS; CHARGE COMPENSATION; CRITICAL PROPERTIES; CRITICAL THICKNESS; DEPOLARIZATION FIELDS; ELECTRODE INTERFACE; FERROELECTRIC CAPACITORS; INTERFACES AND SURFACES; METAL CAPACITORS; MISFIT STRAINS; NANO SCALE; NANOSCALE METALS; NEAR-SURFACE; SPONTANEOUS POLARIZATIONS; STABILITY ANALYSIS; SURFACE AND INTERFACES; SURFACES AND INTERFACES; THERMODYNAMIC MODEL; TRAJECTORY-BASED;

EID: 77949539858     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.01.039     Document Type: Article
Times cited : (29)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.