An incremental approach for pattern diagnosability in distributed discrete event systems

Proceedings - International Conference on Tools with Artificial Intelligence, ICTAI

Volumn , Issue , 2009, Pages 123-130

  Ye, Lina ^a   Dague, Philippe ^a   Yan, Yuhong ^b  

^a UFR 919 Laboratoire d'Informatique Pour la Mécanique et les Sciences de l'Ingénieur   (France)

^b Dept of Electrical and Computer Engineering   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CENTRALIZED APPROACHES; DESIGN STAGE; DIAGNOSABILITY; DIAGNOSIS ALGORITHMS; DIAGNOSIS PROBLEM; DISCRETE EVENT SYSTEMS; DISTRIBUTED APPROACHES; EVALUATION RESULTS; FAULT EVENT; GLOBAL CONSISTENCY; GLOBAL MODELS; INCREMENTAL APPROACH; PARTIAL CRITICAL PATH; PARTIALLY OBSERVABLE SYSTEMS; PLANT CONSTRUCTION; RELATIVE INFORMATION; STATE SPACE;

LEARNING ALGORITHMS; PATTERN RECOGNITION;

ARTIFICIAL INTELLIGENCE;

EID: 77949506223     PISSN: 10823409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICTAI.2009.75     Document Type: Conference Paper

References (9)

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