메뉴 건너뛰기




Volumn 17, Issue 26, 2009, Pages 23947-23952

A simple and quantitative alignment procedure between solid state cameras

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; MATCHED FILTERS;

EID: 77949505278     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.023947     Document Type: Article
Times cited : (4)

References (7)
  • 3
    • 0038586494 scopus 로고    scopus 로고
    • Full-field optical coherence tomography by two-dimensional heterodyne detection with apair of CCD cameras
    • M. Akiba, K. P. Chan, and N. Tanno, "Full-field optical coherence tomography by two-dimensional heterodyne detection with apair of CCD cameras," Opt. Lett. 28(10), 816-818 (2003).
    • (2003) Opt. Lett. , vol.28 , Issue.10 , pp. 816-818
    • Akiba, M.1    Chan, K.P.2    Tanno, N.3
  • 4
    • 84892562211 scopus 로고    scopus 로고
    • On-axis single shot digital holography using polarization based two sensing channels
    • OSA Technical Digest (CD) Optical Society of America, paper DTuC1
    • D. Kim, and B. J. Baek, "On-Axis Single Shot Digital Holography Using Polarization Based Two Sensing Channels," in Digital Holography and Three-Dimensional Imaging, OSA Technical Digest (CD) (Optical Society of America, 2008), paper DTuC1.
    • (2008) Digital Holography and Three-Dimensional Imaging
    • Kim, D.1    Baek, B.J.2
  • 5
    • 33749016458 scopus 로고    scopus 로고
    • Measurement of optical coefficients of tissue-like solutions using a combination method of infinite and semi-infinite geometries with continuous near infrared light
    • W. Ko, Y. Kwak, and S. Kim, "Measurement of Optical Coefficients of Tissue-like Solutions using a Combination Method of Infinite and Semi-infinite Geometries with Continuous Near Infrared Light," Jpn. J. Appl. Phys.45(No.9A), 7158-7162 (2006).
    • (2006) Jpn. J. Appl. Phys. , vol.45 , Issue.9 A , pp. 7158-7162
    • Ko, W.1    Kwak, Y.2    Kim, S.3
  • 6
    • 59749105192 scopus 로고    scopus 로고
    • Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer
    • J.-W. You, D. Kim, S. Y. Ryu, and S. Kim, "Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer, " Opt. Express 17(3), 1352-1360 (2009).
    • (2009) Opt. Express , vol.17 , Issue.3 , pp. 1352-1360
    • You, J.-W.1    Kim, D.2    Ryu, S.Y.3    Kim, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.