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Volumn , Issue , 2008, Pages 169-183

Photo-, dual- and exoelectron spectroscopy to characterize nanostructures

Author keywords

Dual and exo electron spectroscopy; Nanostructures; Prethreshold photo

Indexed keywords


EID: 77949457392     PISSN: 18746500     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-4020-8903-9-10     Document Type: Article
Times cited : (4)

References (19)
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  • 5
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    • Kane, E.O.1
  • 7
    • 0028407235 scopus 로고
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  • 8
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    • Exoelectron emission of monocrystalline silicon and its practical application
    • (in Russian
    • Dekhtyar Yu.D., Sagalovich G.L. (1988), Exoelectron emission of monocrystalline silicon and its practical application, Proc. USSR Academy of Sci., Physical Ser. 52: 1611-1613. (in Russian).
    • (1988) Proc. USSR Academy of Sci., Physical Ser. , vol.52 , pp. 1611-1613
    • Dekhtyar Yu., D.1    Sagalovich, G.L.2
  • 10
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    • Exoelectron spectroscopy of semiconductors and insulators
    • (in Russian
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  • 17
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    • (in Russian
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  • 18
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    • Electron emission from the solid state surface after mechanical treatment
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    • (1962) Exoelectron Emission , pp. 72-95
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  • 19
    • 79956056056 scopus 로고    scopus 로고
    • Exoelectron emission spectroscopy of silicon nitride thin films
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.