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Volumn , Issue , 2009, Pages 81-95

Application of electron backscatter diffraction to phase identification

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EID: 77949388005     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-88136-2_6     Document Type: Chapter
Times cited : (18)

References (13)
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    • Baba-Kishi KZ (1998) Measurement of crystal parameters on backscatter Kikuchi diffraction patterns. Scanning 20:117-127
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    • Baba-Kishi, K.Z.1
  • 2
    • 0036571012 scopus 로고    scopus 로고
    • Review: Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analyses
    • Baba-Kishi KZ (2002) Review: Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analyses. J Mater Sci 37:1715-1746
    • (2002) J Mater Sci , vol.37 , pp. 1715-1746
    • Baba-Kishi, K.Z.1
  • 3
    • 0024785852 scopus 로고
    • Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups
    • Baba-Kishi KZ, Dingley DJ (1989a) Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups. Scanning 11:305-312
    • (1989) Scanning , vol.11 , pp. 305-312
    • Baba-Kishi, K.Z.1    Dingley, D.J.2
  • 4
    • 0009038359 scopus 로고
    • Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2
    • Baba-Kishi KZ, Dingley DJ (1989b) Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2. J Appl Cryst 22:189-200
    • (1989) J Appl Cryst , vol.22 , pp. 189-200
    • Baba-Kishi, K.Z.1    Dingley, D.J.2
  • 5
    • 0022809075 scopus 로고
    • The welding metallurgy of HASTELLOY alloys C-4, C-22, and C-276
    • Cieslak MJ, Headley TJ, Romig AD Jr (1986) The welding metallurgy of HASTELLOY alloys C-4, C-22, and C-276. Metall Trans A 17 A: 2035-2047
    • (1986) Metall Trans A , vol.17 A , pp. 2035-2047
    • Cieslak, M.J.1    Headley, T.J.2    Romig Jr., A.D.3
  • 7
    • 0000502703 scopus 로고    scopus 로고
    • Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
    • Goehner RP, Michael JR (1996) Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns. J Res Natl Inst Stand Technol 101:301-308
    • (1996) J Res Natl Inst Stand Technol , vol.101 , pp. 301-308
    • Goehner, R.P.1    Michael, J.R.2
  • 8
    • 33947288646 scopus 로고    scopus 로고
    • Application of electron backscatter diffraction to the study of phase transformations
    • Gourgues-Lorenzon AF (2007) Application of electron backscatter diffraction to the study of phase transformations. Int Mater Rev 52:65-128
    • (2007) Int Mater Rev , vol.52 , pp. 65-128
    • Gourgues-Lorenzon, A.F.1
  • 9
    • 0024621199 scopus 로고
    • Electrochemical behavior and its relation to composition and sensitization of NiCrMo alloys in ASTM G-28 solution
    • Heubner UL, Altpeter E, Rockel MB et al (1989) Electrochemical behavior and its relation to composition and sensitization of NiCrMo alloys in ASTM G-28 solution. Corrosion 42:249-259
    • (1989) Corrosion , vol.42 , pp. 249-259
    • Heubner, U.L.1    Altpeter, E.2    Rockel, M.B.3
  • 10
    • 0016985744 scopus 로고
    • An improved Ni-Cr-Mo alloy for corrosion service
    • Hodge FG, Kirchner RW (1976) An improved Ni-Cr-Mo alloy for corrosion service. Corrosion 32:332-336
    • (1976) Corrosion , vol.32 , pp. 332-336
    • Hodge, F.G.1    Kirchner, R.W.2
  • 11
    • 0001270354 scopus 로고
    • Thermal stability of Hastelloy alloy C-276
    • Leonard RB (1969) Thermal stability of Hastelloy alloy C-276. Corrosion 25:222-228
    • (1969) Corrosion , vol.25 , pp. 222-228
    • Leonard, R.B.1
  • 12
    • 0034159998 scopus 로고    scopus 로고
    • Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis
    • Michael JR, Eades JA (2000) Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis. Ultramicroscopy 81:67-81
    • (2000) Ultramicroscopy , vol.81 , pp. 67-81
    • Michael, J.R.1    Eades, J.A.2
  • 13
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    • Electron microscopic analysis of heterogeneous precipitates in Hastelloy C-276
    • Raghavan M, Berkowitz BJ, Scanlon JC (1982) Electron microscopic analysis of heterogeneous precipitates in Hastelloy C-276. Metall Trans A 13 A: 979-984
    • (1982) Metall Trans A , vol.13 A , pp. 979-984
    • Raghavan, M.1    Berkowitz, B.J.2    Scanlon, J.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.