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Volumn 81, Issue 2, 2010, Pages

Plasma potential and energy spread determination using ion beams extracted from an electron cyclotron resonance source

Author keywords

[No Author keywords available]

Indexed keywords

BEAM CURRENTS; BEAM ENERGIES; CURRENT INTENSITY; ELECTRON CYCLOTRON RESONANCE ION SOURCE; ENERGY SPREADS; EXTERNAL BEAM; FIELD PENETRATION; FREE REGION; IN-SITU; INITIAL ENERGY; LINEAR BEAM; LINEAR DEPENDENCE; MAGNETIC ANALYSIS; MEASUREMENT CHAMBER; PLASMA POTENTIAL; SOLID SAMPLES; SOURCE CONDITIONS; SURFACE SCATTERING;

EID: 77949297197     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3272847     Document Type: Conference Paper
Times cited : (8)

References (12)
  • 1
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    • A. G. Drentje, Rev. Sci. Instrum. 0034-6748 74, 2631 (2003). 10.1063/1.1569408
    • (2003) Rev. Sci. Instrum. , vol.74 , pp. 2631
    • Drentje, A.G.1
  • 2
    • 67349276628 scopus 로고    scopus 로고
    • 0022-3115. 10.1016/j.jnucmat.2009.01.142
    • H. Zhang and F. W. Meyer, J. Nucl. Mater. 0022-3115 390, 127 (2009). 10.1016/j.jnucmat.2009.01.142
    • (2009) J. Nucl. Mater. , vol.390 , pp. 127
    • Zhang, H.1    Meyer, F.W.2
  • 3
    • 0033516748 scopus 로고    scopus 로고
    • 0168-583X, () 10.1016/S0168-583X(99)00447-4;, Phys. Scr. T80B, 226 (1999). 10.1238/Physica.Topical.080a00226
    • F. W. Meyer and V. A. Morozov, Nucl. Instrum. Methods Phys. Res. B 0168-583X 157, 297 (1999) 10.1016/S0168-583X(99)00447-4; F. W. Meyer and V. A. Morozov, Phys. Scr. T80B, 226 (1999). 10.1238/Physica.Topical.080a00226
    • (1999) Nucl. Instrum. Methods Phys. Res. B , vol.157 , pp. 297
    • Meyer, F.W.1    Morozov, V.A.2    Meyer, F.W.3    Morozov, V.A.4
  • 7
    • 36448998654 scopus 로고
    • 0034-6748. 10.1063/1.1144583
    • Z. Q. Xie and C. M. Lyneis, Rev. Sci. Instrum. 0034-6748 65, 2947 (1994). 10.1063/1.1144583
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 2947
    • Xie, Z.Q.1    Lyneis, C.M.2
  • 9
    • 77949299477 scopus 로고    scopus 로고
    • SIMION 3D 7.0, INEEL-95/4043, David A. Dahl, Rev. 5, Feb. 2000
    • SIMION 3D 7.0, INEEL-95/4043, David A. Dahl, Rev. 5, Feb. 2000.
  • 10
    • 0009611523 scopus 로고    scopus 로고
    • ECR-based atomic collision physics research at ORNL MIRF
    • edited by J. Gillaspy (Nova Science, Huntington, NY)
    • F. W. Meyer, " ECR-based atomic collision physics research at ORNL MIRF.," in Trapping Highly Charged Ions: Fundamentals and Applications, edited by, J. Gillaspy, (Nova Science, Huntington, NY, 2001).
    • (2001) Trapping Highly Charged Ions: Fundamentals and Applications
    • Meyer, F.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.