Multicharged ion-surface measurements at ORNL MIRF using decelerated beams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 157, Issue 1-4, 1999, Pages 297-303

  Meyer, F W ^a   Morozov, V A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; BINDING ENERGY; CARBON; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; GOLD; ION BEAMS; NEGATIVE IONS; OXYGEN; SCATTERING; SEMICONDUCTOR MATERIALS;

BACKSCATTERED PROJECTILE ENERGY LOSS; CHARGE EXCHANGE; CHARGE STATE DISTRIBUTIONS; DECELERATED BEAMS; INTERACTION ENERGY; MULTICHARGED ION SURFACE INTERACTIONS; PROJECTILE NEUTRALIZATION; ULTRAHIGH VOLTAGE APPARATUS;

ION BOMBARDMENT;

EID: 0033516748     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00447-4     Document Type: Article

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