Structural and magnetotransport properties of Bi thin films grown by thermal evaporation

Journal of Magnetism and Magnetic Materials

Volumn 322, Issue 9-12, 2010, Pages 1460-1463

  Marcano, N ^a   Sangiao, S ^a   De Teresa, J M ^a   Morellon L ^a   Ibarra, M R ^a   Plaza, M ^b   Perez L ^b  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Bismuth; Hall effect; Magnetoresistance; Semimetal; Thin film

Indexed keywords

BI FILMS; BI THIN FILMS; CARRIER DENSITY; CRYSTALLINITIES; ELECTRONS AND HOLES; HALL RESISTIVITY; MAGNETIC FIELD DEPENDENCES; MAGNETO TRANSPORT PROPERTIES; POLYCRYSTALLINE; ROOM TEMPERATURE; SEM; SEMI-METALS; SEMIMETAL; SI(0 0 1);

BISMUTH; CARRIER MOBILITY; ELECTRIC RESISTANCE; GYRATORS; HALL EFFECT; MAGNETOELECTRONICS; MAGNETORESISTANCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; THERMAL EVAPORATION; THIN FILM DEVICES; THIN FILMS; VAPORS; X RAY DIFFRACTION;

MAGNETIC FIELD EFFECTS;

EID: 77949278400     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.03.052     Document Type: Article

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