Contact resistance between Au and solution-processed CNT

Solid-State Electronics

Volumn 54, Issue 5, 2010, Pages 586-589

  Han, Seung Hoon ^a   Lee, Sun Hee ^a   Hur, Ji Ho ^a   Jang, Jin ^a   Park, Young Bae ^b   Irvin, Glen ^b   Drzaic, Paul ^b  

^a Kyung Hee University   (South Korea)

^b Unidym   (United States)

Author keywords

CNT; Contact resistance; Metal

Indexed keywords

CNT; CONTACT AREAS; CONTACT RESISTIVITIES; FLAT SURFACES; SOLUTION-PROCESSED; TEST ELEMENT GROUPS; THREE-DIMENSIONAL SHAPE;

CARBON NANOTUBES; CONTACT RESISTANCE; RESISTORS; THREE DIMENSIONAL;

GOLD;

EID: 77949276960     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2010.01.010     Document Type: Article

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