메뉴 건너뛰기




Volumn 21, Issue 2, 2010, Pages 192-198

Preparation and characterization of cordierite filled PTFE laminates for microwave substrate applications

Author keywords

[No Author keywords available]

Indexed keywords

COEFFICIENT OF THERMAL EXPANSION; DIELECTRIC CONSTANTS; FILLED COMPOSITES; FILLER DISTRIBUTION; FILLER LOADING; FILLING FRACTIONS; LOSS TANGENT; MATRIX; MICROWAVE SUBSTRATES; SEM; SOLID STATE CERAMIC ROUTE; WAVEGUIDE CAVITY;

EID: 77949272271     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-009-9892-5     Document Type: Article
Times cited : (25)

References (20)
  • 3
  • 5
    • 77949261424 scopus 로고
    • US Patent No. 5024871
    • D.J. Arthur, G.S. Swei, US Patent No. 5024871 (1991)
    • (1991)
    • Arthur, D.J.1    Swei, G.S.2
  • 8
    • 0346329976 scopus 로고    scopus 로고
    • 1055.34095 10.1023/B:JPOL.0000004620.71900.16 1:CAS:528: DC%2BD3sXptV2jsbk%3D
    • YC Chen HC Lin YD Lee 2003 J. Poly. Res. 10 247 1055.34095 10.1023/B:JPOL.0000004620.71900.16 1:CAS:528:DC%2BD3sXptV2jsbk%3D
    • (2003) J. Poly. Res. , vol.10 , pp. 247
    • Chen, Y.C.1    Lin, H.C.2    Lee, Y.D.3
  • 12
    • 0032154336 scopus 로고    scopus 로고
    • 10.1143/JJAP.37.5364 10.1143/JJAP.37.5364 1:CAS:528:DyaK1cXmvFOkt7Y%3D
    • T Okamura T Kishino 1998 J. Appl. Phys. 37 5364 10.1143/JJAP.37.5364 10.1143/JJAP.37.5364 1:CAS:528:DyaK1cXmvFOkt7Y%3D
    • (1998) J. Appl. Phys. , vol.37 , pp. 5364
    • Okamura, T.1    Kishino, T.2
  • 14
    • 1842627802 scopus 로고    scopus 로고
    • 10.1023/B:JPOL.0000021757.94577.a3 2004JMatR.19.1C
    • YC Chen HC Lin YD Lee 2004 J. Poly. Res. 11 1 10.1023/B:JPOL.0000021757. 94577.a3 2004JMatR..19....1C
    • (2004) J. Poly. Res. , vol.11 , pp. 1
    • Chen, Y.C.1    Lin, H.C.2    Lee, Y.D.3
  • 15
    • 33846459231 scopus 로고
    • 10.1063/1.341024 10.1063/1.341024 1:CAS:528:DyaL1cXktlSrtr0%3D 1988JAP.63.2466D
    • DC Dube MT Lanagan JH Kim SJ Jang 1988 J. Appl. Phys. 63 2466 10.1063/1.341024 10.1063/1.341024 1:CAS:528:DyaL1cXktlSrtr0%3D 1988JAP....63.2466D
    • (1988) J. Appl. Phys. , vol.63 , pp. 2466
    • Dube, D.C.1    Lanagan, M.T.2    Kim, J.H.3    Jang, S.J.4
  • 17
    • 0142054499 scopus 로고    scopus 로고
    • 10.1016/S0026-2692(02)00038-1 10.1016/S0026-2692(02)00038-1 1:CAS:528:DC%2BD38Xlt1Ghs78%3D
    • MG Todd FG Shi 2002 Microelectron. J. 33 627 10.1016/S0026-2692(02)00038- 1 10.1016/S0026-2692(02)00038-1 1:CAS:528:DC%2BD38Xlt1Ghs78%3D
    • (2002) Microelectron. J. , vol.33 , pp. 627
    • Todd, M.G.1    Shi, F.G.2
  • 18
    • 0001231975 scopus 로고
    • 1:CAS:528:DyaB28XisFShuw%3D%3D
    • K Lichtenecker 1926 Physics 27 115 1:CAS:528:DyaB28XisFShuw%3D%3D
    • (1926) Physics , vol.27 , pp. 115
    • Lichtenecker, K.1
  • 19
    • 0032493223 scopus 로고    scopus 로고
    • 10.1088/0022-3727/31/13/013 1:CAS:528:DyaK1cXks1Sms74%3D 1998JPhD.31.1589Z
    • T Zakri JP Laurent M Vauclin 1998 J. Phys. D. Appl. Phys. (Berl.) 31 1589 10.1088/0022-3727/31/13/013 1:CAS:528:DyaK1cXks1Sms74%3D 1998JPhD...31.1589Z
    • (1998) J. Phys. D. Appl. Phys. (Berl.) , vol.31 , pp. 1589
    • Zakri, T.1    Laurent, J.P.2    Vauclin, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.