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Volumn 283, Issue 10, 2010, Pages 2079-2083
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Transverse superresolution and focal shift with rotational tunable phase mask
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Author keywords
Focal shift; Rotational symmetric polarization pupil mask; Superresolution
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Indexed keywords
APODIZERS;
FOCAL DEPTH;
FOCAL PLANE;
FOCAL SHIFT;
FOCAL SHIFTS;
HALF-WAVE;
IMAGING CHARACTERISTICS;
NUMERICAL RESULTS;
OPTICAL IMAGING SYSTEM;
OPTIMIZED SYSTEM;
PHASE MASKS;
PUPIL MASK;
QUARTER WAVE-PLATE;
SUPER RESOLUTION;
TRANSVERSE RESOLUTION;
TRANSVERSE SUPERRESOLUTION;
NUMERICAL ANALYSIS;
OPTICAL RESOLVING POWER;
OPTICAL SYSTEMS;
OPTOELECTRONIC DEVICES;
POLARIZATION;
FOCUSING;
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EID: 77949271556
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optcom.2010.01.039 Document Type: Article |
Times cited : (11)
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References (28)
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