Thermally-induced and chemically-induced structural changes in layered perovskite-type oxides Nd2 - xSrxNiO4 + δ (x = 0, 0.2, 0.4)

Solid State Ionics

Volumn 181, Issue 8-10, 2010, Pages 402-411

  Nakamura, Takashi ^a   Yashiro, Keiji ^a   Sato, Kazuhisa ^a   Mizusaki, Junichiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

High temperature X ray diffraction measurements; K2NiF4 type oxides; Nd2NiO4; Oxygen nonstoichiometry

Indexed keywords

ACCEPTOR CONCENTRATIONS; ATOMIC ARRANGEMENT; CELL VOLUME; CHEMICAL EXPANSION; EXCESS OXYGEN; EXPANSION COEFFICIENTS; HIGH TEMPERATURE X-RAY DIFFRACTION; HIGH TEMPERATURE X-RAY DIFFRACTION MEASUREMENTS; INTERSTITIAL OXYGEN; LATTICE PARAMETERS; LAYERED PEROVSKITE; NONSTOICHIOMETRIC; ORTHORHOMBIC PHASE; OXYGEN CONTENT; OXYGEN NON-STOICHIOMETRY; PHASE TRANSITION TEMPERATURES; ROCKSALT LAYERS; STRUCTURAL CHANGE; STRUCTURAL INFORMATION; STRUCTURAL PARAMETER; TEMPERATURE DEPENDENCE; TETRAGONAL SYMMETRIES; THERMAL EXPANSION COEFFICIENTS;

HOLOGRAPHIC INTERFEROMETRY; LATTICE CONSTANTS; NEODYMIUM; OXIDE MINERALS; OXYGEN; PEROVSKITE; PHASE DIAGRAMS; PHASE TRANSITIONS; RIETVELD ANALYSIS; RIETVELD METHOD; SALT DEPOSITS; SEMICONDUCTING GALLIUM COMPOUNDS; SUPERCONDUCTING TRANSITION TEMPERATURE; TEMPERATURE DISTRIBUTION; THERMAL EXPANSION; THERMAL STRESS; X RAY DIFFRACTION;

ATMOSPHERIC TEMPERATURE;

EID: 77949266015     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.02.002     Document Type: Article

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