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Volumn , Issue , 2009, Pages 209-212
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A 0.18μm CMOS low-power charge-integration DPS for x-ray imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
A/D CONVERSION;
A/D CONVERTER;
BUILT-IN TESTS;
CIRCUIT IMPLEMENTATION;
CMOS ACTIVE PIXEL SENSORS;
CMOS CIRCUITS;
GAIN PROGRAMMABILITY;
LOSSLESS;
LOW POWER;
METAL TECHNOLOGY;
PIXEL LEVEL;
POLY-SI;
SELF BIASING;
SELF-CANCELLATION;
SUBTHRESHOLD TRANSISTORS;
X-RAY IMAGERS;
XRAY IMAGING;
ANALOG TO DIGITAL CONVERSION;
CMOS INTEGRATED CIRCUITS;
DYNAMIC POSITIONING;
IMAGE SENSORS;
PIXELS;
X RAY ANALYSIS;
BUILT-IN SELF TEST;
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EID: 77749317238
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/BIOCAS.2009.5372046 Document Type: Conference Paper |
Times cited : (6)
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References (5)
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