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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 17, 2009, Pages

Frustration-driven micromagnetic structure in Fe/CoO/Fe thin film layered systems

(9) Brambilla, A a Sessi, P a Cantoni, M a Finazzi, M a Rougemaille, N b Belkhou, R c,d Vavassori, P e,f Duo L a Ciccacci, F a

a POLITECNICO DI MILANO (Italy)

b CNRS (France)

c SINCROTRONE TRIESTE (Italy)

d SYNCHROTRON SOLEIL (France)

e CIC NANOGUNE (Spain)

f UNIVERSITY OF FERRARA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77749313412 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.172401 Document Type: Article

Times cited : (17)

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