Ab initio structure solution from X-ray powder data at moderate resolution: Crystal structure of a microporous layer silicate

Journal of Physical Chemistry B

Volumn 101, Issue 8, 1997, Pages 1292-1297

  Vortmann, Silke ^a   Rius, Jordi ^b   Siegmann, Silvester ^a   Gies, Hermann ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; MODEL STRUCTURES; POROUS MATERIALS; X RAY POWDER DIFFRACTION;

MICROPOROUS LAYER SILICATE; RIETVELD TECHNIQUE; SILICATE BONDING NETWORK;

SILICATES;

EID: 0031075738     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp962162g     Document Type: Article

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