Combined apertureless near-field optical second-harmonic generation/atomic force microscopy imaging and nanoscale limit of detection

Applied Spectroscopy

Volumn 64, Issue 1, 2010, Pages 1-7

  Meyer, Kent A ^a   Ng, Kin C ^b   Gu, Zhanjun ^c   Pan, Zhengwei ^c   Whitten, William B ^a   Shaw, Robert W ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b CALIFORNIA STATE UNIVERSITY   (United States)

^c University of Georgia   (United States)

Author keywords

Apertureless; Carbonate; Degradation; Nanorod; Nanowire; Near field; Nonlinear; NSOM; Passivation; Second harmonic generation; SHG; Surface; Tip enhancement; Zinc oxide

Indexed keywords

CARBON DIOXIDE; CARBONATES; DEGRADATION; DIFFRACTION; HARMONIC ANALYSIS; II-VI SEMICONDUCTORS; LASER EXCITATION; NANORODS; NANOWIRES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; NONLINEAR OPTICS; PASSIVATION; SURFACES; ULTRAFAST LASERS; ZINC OXIDE;

APERTURELESS; LIMIT OF DETECTION; NEAR FIELDS; NONLINEAR; OPTICAL DIFFRACTION LIMIT; OPTICAL SECOND HARMONIC GENERATION; POLARIZATION DATA; SPATIAL RESOLUTION;

HARMONIC GENERATION;

EID: 77649224590     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370210790572070     Document Type: Article

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