Second harmonic generation in the near field and far field: A sensitive tool to probe crystalline homogeneity

Journal of Applied Physics

Volumn 101, Issue 8, 2007, Pages

  Mahieu Williame, Laurent ^a   Grásillon, Samuel ^a   Cuniot Ponsard, Mireille ^b   Boccara, Claude ^a  

^a INSTITUT LANGEVIN   (France)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; LASER PULSES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SURFACE PROPERTIES; THIN FILMS;

CRYSTALLINE HOMOGENEITY; FOCALIZATION; SCANNING NEAR-FIELD OPTICAL MICROSCOPE (SNOM);

HARMONIC GENERATION;

EID: 34247562374     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2719278     Document Type: Conference Paper

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