Investigations of the surface chemical composition and atomic structure of ex-situ sulfur passivated Ge(100)

ECS Transactions

Volumn 25, Issue 3, 2009, Pages 421-432

  Fleischmann, C ^a   Sioncke, S ^b   Schouteden, K ^c   Paredis, K ^a   Beckhoff, B ^d   Muller M ^d   Kolbe, M ^d   Meuris, M ^b   Van Haesendonck, C ^c   Temst, K ^a   Vantomme, A ^a  

^a KU LEUVEN   (Belgium)

^b IMEC   (Belgium)

^c UNIVERSITY OF LEUVEN   (Belgium)

^d PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; PASSIVATION; SEMICONDUCTING GERMANIUM; SULFUR; SURFACE ANALYSIS;

DEGREE OF DISORDER; INTERFACIAL LAYER; PASSIVATED SURFACE; PASSIVATION LAYER; PASSIVATION TREATMENT; SURFACE ANALYSIS TECHNIQUES; SURFACE CHEMICAL COMPOSITION; SURFACE MODELING;

GERMANIUM COMPOUNDS;

EID: 77649198891     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3204433     Document Type: Conference Paper

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