Structural analysis of La2-xSrxNiO4 + δ by high temperature X-ray diffraction

Solid State Ionics

Volumn 181, Issue 5-7, 2010, Pages 292-299

  Nakamura, Takashi ^a   Yashiro, Keiji ^a   Sato, Kazuhisa ^a   Mizusaki, Junichiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

High temperature X ray diffractometry; K2NiF4 type oxides; La2NiO4; Oxygen nonstoichiometry; Rietveld analysis

Indexed keywords

ACCEPTOR CONCENTRATIONS; CELL VOLUME; EXCESS OXYGEN; HIGH TEMPERATURE; HIGH TEMPERATURE X-RAY DIFFRACTION; INTERSTITIAL OXYGEN; K2NIF4 TYPE OXIDES; LATTICE PARAMETERS; LINEAR APPROXIMATIONS; NONSTOICHIOMETRIC; OXYGEN CONTENT; OXYGEN NON-STOICHIOMETRY; ROCKSALT LAYERS; TETRAGONAL SYMMETRIES; THERMAL EXPANSION COEFFICIENTS; TOTAL DIFFERENTIAL; X RAY DIFFRACTOMETRY;

CRYSTAL STRUCTURE; DIFFRACTION; DIFFRACTOMETERS; LANTHANUM; LATTICE CONSTANTS; OXIDE MINERALS; OXYGEN; PEROVSKITE; RIETVELD METHOD; SALT DEPOSITS; STRUCTURAL ANALYSIS; THERMAL EXPANSION; X RAY ANALYSIS; X RAY DIFFRACTION;

RIETVELD ANALYSIS;

EID: 77649193427     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.01.007     Document Type: Article

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