A nonlinear probabilistic method for process monitoring

Industrial and Engineering Chemistry Research

Volumn 49, Issue 4, 2010, Pages 1770-1778

  Ge, Zhiqiang ^a   Song, Zhihuan ^a  

^a STATE KEY LABORATORY OF INDUSTRIAL CONTROL TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DIAGNOSIS; GENERATIVE TOPOGRAPHIC MAPPING; LINEAR PROCESS; MONITORING PERFORMANCE; NONLINEAR PROCESS; PROBABILISTIC METHODS;

FAILURE ANALYSIS; PROCESS CONTROL; PROCESS MONITORING;

PRINCIPAL COMPONENT ANALYSIS;

EID: 77649153368     PISSN: 08885885     EISSN: 15205045     Source Type: Journal    
DOI: 10.1021/ie900858v     Document Type: Article

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