Annealing effect on the structural andmagnetic properties of nickel ferrite thin films

Surface and Interface Analysis

Volumn 42, Issue 3, 2010, Pages 151-156

  Dixit, G ^a   Singh, J P ^a   Srivastava, R C ^a   Agrawal, H M ^a   Choudhary, R J ^b   Guptab, A ^b  

^a G B PANT UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (India)

^b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Annealing; Ferrites; PLD; Raman spectroscopy; Thin films; VSM; XRD; XRR

Indexed keywords

ANNEALING EFFECTS; HIGH RESISTIVITY; INVERSE SPINEL STRUCTURES; NICKEL FERRITE; PLANAR CIRCUIT; PLD; SI (100) SUBSTRATE; SOFT FERRITE; STRUCTURAL AND MAGNETIC PROPERTIES; SURFACE PROFILOMETERS; THICKNESS OF THE FILM; X RAY REFLECTIVITY; XRD;

ANNEALING; DEPOSITION; FERRITE; MAGNETIC PROPERTIES; NICKEL; NICKEL ALLOYS; PROGRAMMABLE LOGIC CONTROLLERS; PULSED LASER DEPOSITION; PULSED LASERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

FERRITES;

EID: 77449142716     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3195     Document Type: Article

References (31)

1. C. M. Williams, D. B. Chrisey, P. Lubitz, K. S. Grabowski, C. M. Cottel, J. Appl. Phys. 1994, 75, 1676.
2. F. J. Cadieu, R. Rani, W. Mendoza, B. Peng, S. A. Shaheen, M. J. Hurben, C. E. Patton, J. Appl. Phys. 1997, 81, 4801.
3. M. Matsuoka, Y. Matsuda, Y. Yoshi, M. Naoe, J. Magn. Magn. Mater 1986, 54, 1603.
4. S. A. Oliver, C. Vittoria, G. Balestrino, S. Martelluchi, G. Petrocelli, A. Tabano, P. Paroli, IEEE Trans.Magn. 1994, MAG-30, 4933.
5. D. T. Margulies, F. T. Parker, F. E. Spada, R. S. Goldman, J. Li, R. Sinclair, A. E. Berkowitz, Phys. Rev. B 1996, 53, 9175.
6. G. Caruntu, I. Dumitru,G. G. Bush,D. Caruntu, C. J. O. Connor, J.Phys. D: Appl. Phys. 2005, 38, 811.
7. B. R. Acharya, S. Prasad, N. Venkataramani, S. N. Shringi, R. Krishnan, J. Appl. Phys. 1996, 79, 478.
8. O. F. Caltum, J. Optoelectron. Adv.Mater. 2005, 7, 739.
9. O. F. Caltum, J. Optoelectron. Adv.Mater. 2004, 6, 935.
10. P. Samarasekara, R. Rani, F. J. Cadieu, J. Appl. Phys. 2006, 79, 5425.
11. T. Johnson Matthew,G. Paul Kotula, C. Barry Carter, J. CrystalGrowth 1999, 206, 299.
12. C.N. Chinnasamy, S. D. Yoon, A. Yang, A. Baraskar, C. Vittoria, V. G. Harris, J. Appl. Phys. 2007, 01, 09M517.
13. F. Liu, C. Yang, T. Ren, A. Z. Wang, Jun Yu, L. Liu, J. Magn. Magn. Mater. 2007, 309, 75.
14. S. H. Pawar, P. S. Patil, R. D. Madhale, C. D. Lokhande, Indian J. Pure & Appl. Phys. 1989, 77, 227.
15. X. Wang, X. Chen, X. Ma, H. Zheng, M. Ji, Z. Zhang, Chem. Phys. Lett. 2004, 384, 391.
16. S. Venzke, R. B. Van Dover, J. M. Phillips, E. M. Gyorgy, T. Siegrist, C. H. Chen, D. Werder, R. M. Fleming, R. J. Felder, E. Coleman, R. Opila, J.Mater. Res. 1996, 11, 1187.
17. J. Dash, S. Prasad, N. Venkataramani, R. Krishnan, P. Kishan, N. Kumar, S. D. Kulkarni, S. K. Date, J. Appl. Phys. 1999, 86, 3303.
18. M. Sorescu, L. Dia Mandescu, R. Swaminathan, M. E. Mc Henry, M. Feder, J. Appl. Phys. 2008, 97, 10G105.
19. B. D. Cullity, Elements of X-ray Diffraction, Addison Wesley Publishing:Massachusetts, 1959.
20. M. H. Mahmoud, C. M. Williams, J. Cai, I. Siu, J. C. Walker, J. Magn. Magn.Mater. 2003, 261, 314.
21. M. H. Ibrahim, M. S. Seehra, G. Srinivasan, J. App. Phys. 1994, 75, 6822.
22. J. Bruneaux,H. Cachet,M. Froment,A. Messad, ThinSolidFilms1991, 197, 129.
23. P. R. Graves, C. Johnston, J. J. Campaniello, Mat. Res. Bull. 1988, 23, 1651.
24. M. V. Vasic, B. Antic, A. Kremenovic, A. S. Nikolic, M. Stoiljkovic, N. Bibic, V. Spasojevic, Ph. Colomban, Nanotechnology 2006, 17, 4877.
25. A. H. Morrish, The Physical Princilpes ofMagnetism,Wiley: New York, 1965.
26. T. Kaneyoshi, Introduction to Amorphous Magnets, World Scientific: Singapore, 1992.
27. E.M. Chudnovsky, W. M. Saslow, R. A. Sarota, Phy. Rev. B 1986, 33, 251.
28. J. Dash, S. Prasad, N. Venkataramani., R. Krishnan, P. Kishan, N. Kumar, S. D. Kulkarni, S. K. Date, J. Appl. Phys. 1999, 86, 3303.
29. Y. C. Yang, J. Ding, J. B. Yi, B. H. Liu, T. Yu, Z. X. Shen, J. Magn. Magn. Mater. 2004, 282, 211.
30. U. Luders, M. Bibes, J. F. Bobo, M. Cantoni, R. Bertacco, J. Fontcuberta, Phys. Rev. B 2005, 71, 134419.
31. M. Desai, S. Prasad, N. Venkataramani, I. Samajdar, A. K. Nigam, N. Keller, R. Krishnan, E. M. Baggio-Saitovitch, B. R. Pujada, A. Rossi, J. Appl. Phys. 2002, 91, 7592.