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Volumn 6, Issue , 2004, Pages 155-158
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Analysis of terahertz-emitting SiGe quantum cascade structures by transmission electron microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION MEASUREMENT;
LOW-PRESSURE CHEMICAL VAPOR DEPOSITION SYSTEM;
MECHANICAL POLISHING;
QUANTUM WELL STRUCTURE;
CHEMICAL VAPOR DEPOSITION;
ENERGY DISSIPATION;
GERMANIUM ALLOYS;
MORPHOLOGY;
SEMICONDUCTING SILICON;
SILICON ALLOYS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 7744232343
PISSN: 14780585
EISSN: None
Source Type: Book Series
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (6)
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