Critical parameters for the one-dimensional systems with long-range correlated disorder

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 5, 2010, Pages 1425-1430

  Zhao, Yi ^a   Duan, Suqing ^a   Zhang, Wei ^a  

^a INSTITUTE OF APPLIED PHYSICS AND COMPUTATIONAL MATHEMATICS   (China)

Author keywords

Correlated disorder; Critical exponents; Critical parameters; Mobility edges

Indexed keywords

CORRELATED DISORDER; CRITICAL EXPONENT; CRITICAL PARAMETER; DEGREE OF CORRELATIONS; DIAGONAL DISORDER; DISORDER STRENGTH; EIGENSTATES; FINITE-SIZE SCALING ANALYSIS; LOCALIZATION LENGTH; ONE-DIMENSIONAL (1D) MODELS; ONE-DIMENSIONAL SYSTEMS; POWER-LAW; TIGHT BINDING;

METAL INSULATOR BOUNDARIES; SEMICONDUCTOR INSULATOR BOUNDARIES; SPECTRAL DENSITY; TRANSFER MATRIX METHOD;

METAL INSULATOR TRANSITION;

EID: 77349127565     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.11.089     Document Type: Article

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