Minimal cutsets-based reduction approach for the use of binary decision diagrams on probabilistic safety assessment fault tree models

Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability

Volumn 223, Issue 4, 2009, Pages 301-311

  Ibanez Llano C ^a   Rauzy, A ^b   Melendez E ^c   Nieto, F ^a  

^a ICAI School of Engineering   (Spain)

^b DASSAULT SYSTÈMES   (France)

^c Presidenta de la Comisión Nacional de Radiofísica Vocal del Comité Asesor del Consejo de Seguridad Nuclear Expresidenta de la Sociedad Española de Protección Radiológica   (Spain)

Author keywords

Binary cecision diagrams; Fault tree analysis; Minimal cutsets; Probabilistic safety assessment; Variable ordering heuristics

Indexed keywords

ASSESSMENT METHODS; COMPUTATION PROCESS; COMPUTATIONAL RESOURCES; CONVERSION PROCEDURES; EVENT TREES; FAULT TREE MODEL; FAULT-TREES; HYBRID ALGORITHMS; MINIMAL CUTSETS; NEW APPROACHES; POTENTIAL SOLUTIONS; PROBABILISTIC SAFETY ASSESSMENT; RELIABILITY MODEL; REWRITING STRATEGIES; STATIC AND DYNAMIC; STRUCTURAL INFORMATION; TOPOLOGICAL INFORMATION; VARIABLE ORDERING; VARIABLE ORDERING HEURISTICS;

BINARY DECISION DIAGRAMS; COMPUTATIONAL COMPLEXITY; FAULT TREE ANALYSIS; GRAPHIC METHODS; HEURISTIC METHODS; NUCLEAR INDUSTRY; PEELING; RELIABILITY;

QUALITY ASSURANCE;

EID: 77149157484     PISSN: 1748006X     EISSN: 17480078     Source Type: Journal    
DOI: 10.1243/1748006XJRR259     Document Type: Article

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