Variable ordering schemes to apply to the binary decision diagram methodology for event tree sequences assessment

Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability

Volumn 222, Issue 1, 2008, Pages 7-16

  Ibanez Llano C ^a   Melendez E ^b   Nieto, F ^a  

^a Universidad Pontificia Comillas   (Spain)

^b Presidenta de la Comisión Nacional de Radiofísica Vocal del Comité Asesor del Consejo de Seguridad Nuclear Expresidenta de la Sociedad Española de Protección Radiológica   (Spain)

Author keywords

binary decision diagrams; event tree analysis; probabilistic risk assessment; variable ordering heuristics

Indexed keywords

EID: 84993683812     PISSN: 1748006X     EISSN: 17480078     Source Type: Journal    
DOI: 10.1243/1748006XJRR67     Document Type: Article

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