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Volumn 246, Issue 11-12, 2009, Pages 2809-2812
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The morphology of silicon nanowire samples: A Raman study
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Author keywords
[No Author keywords available]
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Indexed keywords
HEAT CONVECTION;
LASER EXCITATION;
MORPHOLOGY;
NANOWIRES;
RED SHIFT;
SILICON COMPOUNDS;
63.22.GH;
78.30.NA;
78.67.LT;
AMBIENT CONDITIONS;
SAMPLE MORPHOLOGY;
SILICON NANOWIRES;
TEMPERATURE BEHAVIOR;
THERMAL CONVECTIONS;
SILICON;
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EID: 77149128661
PISSN: 03701972
EISSN: 15213951
Source Type: Journal
DOI: 10.1002/pssb.200982341 Document Type: Article |
Times cited : (12)
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References (9)
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