Stress-induced photoluminescence in porous silicon films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7375, Issue , 2009, Pages

  Huang, Yuan Ming ^a   Zhou, Fu Fang ^a   Zhai, Bao Gai ^a  

^a YUNNAN NORMAL UNIVERSITY   (China)

Author keywords

Bond order length strength correlation model; Lattice mismatch; Mechanical stress; Porous silicon film; Silicon nano crystallites

Indexed keywords

BOND ORDERS; CIRCULAR BOUNDARIES; CORRELATION MODELS; MECHANICAL STRESS; MICRO RAMAN SPECTROSCOPY; POROUS SILICON FILMS; RADIAL DIRECTION; RAMAN SHIFT; RED PHOTOLUMINESCENCE; SILICON FILMS; STRESS-INDUCED;

CRYSTALLITES; LATTICE MISMATCH; MECHANICS; METALLIC FILMS; PHOTOLUMINESCENCE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; STRESS ANALYSIS; THIN FILMS;

POROUS SILICON;

EID: 77049111293     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.839344     Document Type: Conference Paper

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