Carrier density dependent electric transport of serially connected two quantum point contacts

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 4, 2010, Pages 1122-1125

  Liu, K M ^a   Lin, H I ^a   Umansky, V ^b   Hsu, S Y ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

Adiabatic transport; Ohmic transport; Quantum point contacts in series; Transmission probability

Indexed keywords

ADIABATIC TRANSPORT; CARRIER DENSITY; COHERENCE LENGTHS; D ELECTRONS; DOUBLE-QUANTUM; EDGE-TO-EDGE; ELECTRIC TRANSPORT; ELECTRON DENSITIES; GAAS; HETEROSTRUCTURES; INSULATING LAYERS; LOW DENSITY; LOW TEMPERATURES; MEAN FREE PATH; METAL GATE; OHMIC TRANSPORT; PARAMETER T; QUANTUM POINT CONTACT; TOP GATE; TRANSMISSION PROBABILITIES;

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRON GAS; ELECTRONS; GALLIUM; POINT CONTACTS; PRASEODYMIUM COMPOUNDS; PROBABILITY; QUANTUM THEORY; TWO DIMENSIONAL ELECTRON GAS;

QUANTUM CHEMISTRY;

EID: 76949084143     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.11.094     Document Type: Article

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