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Applied Physics A: Materials Science and Processing

Volumn 98, Issue 3, 2010, Pages 499-507

In-situ characterization of metal clusters supported on a birefringent substrate using reflectance difference spectroscopy

(6) Flores Camacho, J M a Weidlinger, G a Saucedo Zeni, N a Sun, L D a Hohage, M a Zeppenfeld, P a

a JOHANNES KEPLER UNIVERSITY LINZ (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AG CLUSTERS; ANISOTROPIC PARTICLES; CLUSTER FILMS; ELECTROSTATIC IMAGES; IN-PLANE; IN-SITU CHARACTERIZATION; METAL CLUSTER; PARTICLE AGGREGATION; PLASMON RESONANCES; REFLECTANCE DIFFERENCE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY IMAGE; SPECTRAL RANGE; STRUCTURAL ANISOTROPY;

ANISOTROPY; BIREFRINGENCE; FILM GROWTH; REFLECTION; RESONANCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SILVER; SUBSTRATES;

AGGLOMERATION;

EID: 76749148489 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-009-5484-8 Document Type: Article

Times cited : (6)

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