On-chip single plasmon detection

Nano Letters

Volumn 10, Issue 2, 2010, Pages 661-664

  Heeres, Reinier W ^a   Dorenbos, Sander N ^a   Koene, Benny ^a   Solomon, Glenn S ^b   Kouwenhoven, Leo P ^a   Zwiller, Valery ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Nanophotonics; Semiconductor quantum dots; Single surface plasmons; Superconducting detectors

Indexed keywords

CORRELATION MEASUREMENT; ELECTRICAL DETECTION; INTERFACE ELECTRONICS; NEAR-FIELD; ON CHIPS; QUANTUM DOT; QUANTUM-INFORMATION PROCESSING; SINGLE PHOTON EMISSION; SUPERCONDUCTING DETECTOR; SUPERCONDUCTING DETECTORS; SURFACE PLASMON POLARITONS; SURFACE PLASMONS;

DATA PROCESSING; DETECTORS; NANOPHOTONICS; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL WAVEGUIDES; PHOTONICS; PHOTONS; QUANTUM OPTICS; SEMICONDUCTOR QUANTUM DOTS; SUPERCONDUCTIVITY;

PLASMONS;

NANOPARTICLE; QUANTUM DOT;

ARTICLE; CHEMISTRY; ELECTRONICS; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE PLASMON RESONANCE; TEMPERATURE;

ELECTRONICS; EQUIPMENT DESIGN; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; NANOPARTICLES; NANOTECHNOLOGY; QUANTUM DOTS; SURFACE PLASMON RESONANCE; TEMPERATURE;

EID: 76749140951     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl903761t     Document Type: Article

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