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Volumn 834, Issue 1-4, 2010, Pages 784c-787c
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Detection Properties and Radiation Damage Effects in SiC Diodes Irradiated with Light Ions
a,b a,b b,c a,b a,b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 76749097255
PISSN: 03759474
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nuclphysa.2010.01.146 Document Type: Article |
Times cited : (17)
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References (8)
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