Incorporation of Bi, Cd and Zn on the optical properties of Ge20Se80 thin films

Physica B: Condensed Matter

Volumn 405, Issue 7, 2010, Pages 1846-1851

  Aly, K A ^a   Afify, N ^b   Aboushly, A M ^a  

^a AL AZHAR UNIVERSITY   (Egypt)

^b Assiut University   (Egypt)

Author keywords

Amorphous semiconductors; Optical constants; Optical properties; X ray diffraction

Indexed keywords

ABSORPTION COEFFICIENTS; CLEANED GLASS SUBSTRATES; COMPLEX REFRACTIVE INDEX; DIRECT ANALYSIS; IMAGINARY PARTS; INTERFERENCE FRINGE; LOCALIZED STATE; NORMAL INCIDENCE; REAL PART; SINGLE-OSCILLATOR MODEL; THERMAL EVAPORATION METHOD; TRANSMISSION SPECTRUMS; WAVELENGTH RANGES;

AMORPHOUS SEMICONDUCTORS; DIFFRACTION; GERMANIUM; OPTICAL CONSTANTS; REFRACTIVE INDEX; SEMICONDUCTING FILMS; SEMICONDUCTING GLASS; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION; ZINC;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 76449094403     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2010.01.060     Document Type: Article

References (32)

1. Aly K.A. J. Non-Cryst. Solids 355 (2009) 1489
2. Kastner M. Phys. Rev. Lett. 28 (1972) 355
3. Othman A.A., Aly K.A., and Abousehly A.M. Thin Solid Films 515 7-8 (2007) 3507
4. Aly K.A., Dahshan A., and Abousehly A.M. Philos. Mag. 88 (2008) 47
5. Swanepoel R. J. Phys. E: Sci. Instrum. 16 (1983) 1214
6. Shaaban E.R., Abdel-Rahman M., and El Sayed Y. Thin Solid Films 515 (2007) 3810
7. Gonzalez-Leal J.M., Prieto-Alcon R., and Stuchlik M. Opt. Mater. 27 (2004) 147
8. Manifacier J.C., Gasiot J., and Fillard J.P. J. Phys. E: Sci. Instrum. 9 (1976) 1002
9. Swanepoel R. J. Phys. E: Sci. Instrum. 17 (1984) 896
10. Hamman M., Harith M.A., and Osman W.H. Solid State Commun. 59 (1986) 271
11. Kalomiros J.A., and Spyridelis J. Phys. Status Solidi (a) 107 (1988) 633
12. Marquez E., Ramirez-Malo J., and Villares P. J. Phys. D: Appl. Phys. 25 (1992) 535
13. Jenkins F.A., and White H.E. Fundamentals of Optics (1957), McGraw-Hill, New York
14. Moss T.S. Optical Properties of Semiconductors (1959), Buttenworths, London
15. Wemple S.H., and DiDomenico M. Phys. Rev. B 3 (1971) 1338
16. Tanaka K. Thin Solid Films 66 (1980) 271
17. Kumar G., Thomas J., George N., Kumar B., Shnan P., Npoori V., Vallabhan C., and Unnikrishnan N. Phys. Chem. Glasses 41 (2001) 89
18. Connell G.A.N., and Lewis A.J. Phys. Status Solidi (b) 60 (1973) 291
19. Davis E.A., and Mott N.F. Philos. Mag. 22 (1970) 903
20. Fritzsche H. Philos. Mag. B 68 (1993) 561
21. Urbach F. Phys. Rev. 92 (1953) 1324
22. Nagel P., Tichy L., Triska A., and Ticha H. J. Non-Cryst. Solids 59/60 (1983) 1015
23. Ham D., Mishra K.K., and Rajeshwar K. J. Electrochem. Soc. 138 (1991) 100
24. Allongue Ph., and Tenne R. J. Electrochem. Soc. 138 (1991) 261
25. Bard A.J., Bocarsly A.B., Tam F.R.I., Waallon E.G., and Wrightor M.S. J. Am. Chem. Soc. 102 (1980) 373
26. Shimakawa K. J. Non-Cryst. Solids 43 (1981) 229
27. Dona J.M., and Herrero J. J. Electrochem. Soc. 142 (1995) 764
28. Schoenmakers G.H., Bakkers E.P.A.M., and Kelly J.J. J. Electrochem. Soc. 144 (1997) 2329
29. Singh K., and Pathak R.K. Electrochim. Acta 39 (1994) 2693
30. Tauc J. In: Abeles F. (Ed). The Optical Properties of Solids (1970), North Holland, Amsterdam 227
31. Choi J., Singh A., Davis E.A., and Gurman S.J. J. Non-Cryst. Solids 198-200 (1996) 680
32. Mott N.F., and Davis E.A. Electronic Processes in Non-Cystalline Materials (1971), Clarendon, Oxford