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Volumn 42, Issue 2, 2006, Pages 63-67

Quantification and classification of cracks in aircraft multi-layered structure

Author keywords

Aircraft structure; Crack; Defect classification; Quantification; Scanned pulsed eddy current

Indexed keywords

AIRCRAFT STRUCTURE; DEFECT CLASSIFICATION; QUANTIFICATION; SCANNED PULSED EDDY CURRENT;

EID: 33646126927     PISSN: 05776686     EISSN: None     Source Type: Journal    
DOI: 10.3901/JME.2006.02.063     Document Type: Article
Times cited : (39)

References (7)
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  • 2
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    • Scanned pulsed-eddy-current instrument for non-destructive inspection of aging aircraft
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    • (1996) SPIE , vol.2945 , pp. 2-13
    • Moulder, J.C.1    Bieber, J.A.2    Ward, W.W.3
  • 3
    • 0033121658 scopus 로고    scopus 로고
    • Flaws characterization with pulsed eddy currents N.D.T.
    • CLAUZON T, THOLLON F, NICOLAS A. Flaws characterization with pulsed eddy currents N.D.T.[J]. IEEE Transactions on Magnetics, 1999, 35(3): 1873-1876.
    • (1999) IEEE Transactions on Magnetics , vol.35 , Issue.3 , pp. 1873-1876
    • Clauzon, T.1    Thollon, F.2    Nicolas, A.3
  • 4
    • 0035123997 scopus 로고    scopus 로고
    • Transient eddy current NDE for ageing aircraft-capabilities and limitations
    • SMITH R A, HUGO G R. Transient eddy current NDE for ageing aircraft-capabilities and limitations[J]. Insight, 2001, 43(1): 14-25.
    • (2001) Insight , vol.43 , Issue.1 , pp. 14-25
    • Smith, R.A.1    Hugo, G.R.2
  • 6
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    • Defect classification using a new feature for pulsed eddy current sensors
    • TIAN G Y, SOPHIAN A. Defect classification using a new feature for pulsed eddy current sensors[J]. NDT and E International, 2005, 38: 77-82.
    • (2005) NDT and E International , vol.38 , pp. 77-82
    • Tian, G.Y.1    Sophian, A.2
  • 7
    • 0025516791 scopus 로고
    • Numerical simulation of pulsed eddy current nondestructive testing phenomena
    • DAI X W, LUDWIG R, PALANISAMY R. Numerical simulation of pulsed eddy current nondestructive testing phenomena[J]. IEEE Transactions on Magnetics, 1990, 26(6): 3089-3096.
    • (1990) IEEE Transactions on Magnetics , vol.26 , Issue.6 , pp. 3089-3096
    • Dai, X.W.1    Ludwig, R.2    Palanisamy, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.