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Applied Physics Letters

Volumn 96, Issue 5, 2010, Pages

Structural and electrical properties of ZnO nanorods and Ti buffer layers

(6) Kwak, C H a Kim, B H b Park, C I b Seo, S Y a Kim, S H a Han, S W b

a Pohang University of Science and Technology (POSTECH) (South Korea)

b Chonbuk National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONTACTS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; IV CHARACTERISTICS; METAL-ORGANIC; STRUCTURAL AND ELECTRICAL PROPERTIES; TEM; WELL-ALIGNED; ZNO NANOROD;

BUFFER LAYERS; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; NANORODS; OPTICAL WAVEGUIDES; ORGANIC CHEMICALS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

EPITAXIAL LAYERS;

EID: 76449092779 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3308498 Document Type: Article

Times cited : (13)

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