Atomic force microscopy-based single-cell indentation: Experimentation and finite element simulation

2009 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2009

Volumn , Issue , 2009, Pages 1326-1332

  Ladjal, Hamid ^a   Hanus, Jean Luc ^a   Pillarisetti, Anand ^b   Keefer, Carol ^b   Ferreira, Antoine ^a   Desai, Jaydev P ^b  

^a ENSI de Bourges   (France)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; AFM PROBE; AFM TIP; ATOMIC FORCE MICROSCOPES; BIOPHYSICAL PROPERTIES; COMPARISON STUDY; COMPUTATIONAL MODEL; CONTACT MODELS; FINITE ELEMENT SIMULATIONS; FORCE FEEDBACK; HAPTIC FEEDBACK DEVICES; HUMAN OPERATOR; INDENTATION TEST; MECHANICAL BEHAVIOR; MECHANICAL CHARACTERIZATIONS; MOUSE EMBRYONIC STEM CELLS; NANOMANIPULATIONS; RELAXATION MEASUREMENTS; SINGLE CELLS; TESTING CONFIGURATIONS; THEORETICAL MODELS; UNDIFFERENTIATED CELLS;

ATOMIC FORCE MICROSCOPY; ATOMS; BIOINFORMATICS; BIOMECHANICS; CYTOLOGY; DEFORMATION; FORCE MEASUREMENT; INTELLIGENT ROBOTS; MECHANICAL PROPERTIES; THERMAL BARRIER COATINGS;

STEM CELLS;

EID: 76349098228     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IROS.2009.5354351     Document Type: Conference Paper

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