Corona and arcing in power and RF devices

2009 IEEE Symposium on Product Compliance Engineering, PSES 2009 - Proceedings

Volumn , Issue , 2009, Pages

  Moongilan, Dheena ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC POWER; CORONA ONSET; CRITICAL VALUE; DISCHARGE PHENOMENA; ELECTRICAL INSULATION; ELECTRICAL SYSTEMS; FREQUENCY DOMAIN TECHNIQUES; HIGH FREQUENCY; HIGH VOLTAGE; HUMIDITY CHANGE; MULTIPACTING; POWER FREQUENCY; POWER-LOSSES; RESEARCH TOPICS; RF DEVICES; RF FIELDS; RF FREQUENCIES; RF INTERFERENCE; RF-CIRCUITS; RISETIMES; SURFACE AREA;

ELECTRIC FIELDS; RADIOFREQUENCY SPECTROSCOPY;

ELECTRIC CORONA;

EID: 76249106385     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PSES.2009.5356021     Document Type: Conference Paper

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