Broadband characterization of complex permittivity for low-loss dielectrics: Circular PC board disk approach

IEEE Transactions on Antennas and Propagation

Volumn 57, Issue 10 PART 2, 2009, Pages 3126-3135

  Guo, Zhonghai ^a   Pan, Guangwen ^a   Hall, Stephen ^b   Pan, Christopher ^c  

^a Arizona State University   (United States)

^b INTEL CORPORATION   (United States)

^c QUALCOMM INC   (United States)

Author keywords

Dielectric measurements; High speed digital circuit; Loss tangent; Microwave measurements; Real permittivity; Self consistency

Indexed keywords

802.11B/G; ANALYTIC EXPRESSIONS; BROADBAND CHARACTERIZATION; CIRCULAR DISK; CLOSED FORM; COMPLEX PERMITTIVITY; CYLINDRICAL SYMMETRY; DIELECTRIC MEASUREMENTS; FRINGING FIELDS; HIGH PRECISION; HIGH SPEED DIGITAL CIRCUIT; KRAMERS-KRONIG; LOSS TANGENT; LOW LOSS; MULTIPLE RESONANCES; NONDESTRUCTIVE METHODS; NUMERICAL RESULTS; PC BOARDS; PERMITTIVITY AND LOSS; RADIATION LOSS; SELF-CONSISTENCY;

DIELECTRIC MATERIALS; DIGITAL INTEGRATED CIRCUITS; DISKS (STRUCTURAL COMPONENTS); MICROWAVE MEASUREMENT; MICROWAVES; NUMERICAL ANALYSIS; PERMITTIVITY; PRINTED CIRCUIT MANUFACTURE; WIMAX; WIRELESS LOCAL AREA NETWORKS (WLAN);

PRINTED CIRCUIT BOARDS;

EID: 76149100564     PISSN: 0018926X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TAP.2009.2028525     Document Type: Article

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