Element-specific electronic structure of Mn dopants and ferromagnetism of (Zn,Mn)O thin films

Thin Solid Films

Volumn 518, Issue 10, 2010, Pages 2825-2829

  Jin, J ^a   Chang, G S ^b   Boukhvalov, D W ^c,d   Zhang, X Y ^a   Finkelstein, L D ^c   Xu, W ^a   Zhou, Y X ^a   Kurmaev, E Z ^c   Moewes, A ^b  

^a Surface Physics Laboratory National Key Laboratory   (China)

^b UNIVERSITY OF SASKATCHEWAN   (Canada)

^c INSTITUTE OF METAL PHYSICS   (Russian Federation)

^d RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

(Zn,Mn)O; Electronic structure; Ferromagnetism; Soft X ray spectroscopy

Indexed keywords

(ZN,MN)O; DEFECT CONFIGURATIONS; DENSITY FUNCTIONAL THEORY CALCULATIONS; EXPERIMENTAL SPECTRA; FERROMAGNETIC PROPERTIES; MN ATOMS; MN CONCENTRATIONS; MN IMPURITY; PARTIAL DENSITY OF STATE; SOFT X-RAY; SPECTROSCOPIC MEASUREMENTS; THEORETICAL MODELS; X-RAY ABSORPTION AND EMISSION SPECTROSCOPY; ZNO;

ABSORPTION SPECTROSCOPY; DEFECT DENSITY; DEFECTS; DENSITY FUNCTIONAL THEORY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FERROMAGNETISM; MAGNETIC SEMICONDUCTORS; MANGANESE; THIN FILMS; X RAY SPECTROSCOPY; ZINC; ZINC OXIDE;

MANGANESE COMPOUNDS;

EID: 76049093678     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.12.100     Document Type: Article

References (27)

1. Ohno H. Science 281 (1998) 951
2. Wolf S.A., Awschalom D.D., Buhrman R.A., Daughton J.M., von Molnar S., Roukes M.L., Chtchelkanova A.Y., and Treger D.M. Science 294 (2001) 1488
3. Özgür Ü., Alivov Ya.I., Liu C., Teke A., Reshchikov M.A., Doǧan S., Avrutin V., Cho S.-J., and Morkoç H. J. Appl. Phys. 98 (2005) 041301
4. Dietl T., Ohno H., Matsukura F., Cibert J., and Ferrand D. Science 287 (2000) 1019
5. Philipose U., Nair S.V., Trudel S., de Souza C.F., Aouba S., Hill R.H., and Ruda H.E. Appl. Phys. Lett. 88 (2006) 2631101
6. Duan L.B., Rao G.H., Yu J., Wang Y.C., Chu W.G., and Zhang L.N. J. Appl. Phys. 102 (2007) 103907
7. Banerjee S., Rajendran K., Gayathri N., Sardar M., Senthilkumar S., and Sengodan V. J. Appl. Phys. 104 (2008) 043913
8. Schumm M., Koerdel M., Müller S., Zutz H., Ronning C., Stehr J., Hofmann D.M., and Geurts J. New J. Phys. 10 (2008) 043004
9. Di Trolio A., Veroli C., Testa A.M., and Fiorani D. Superlattices Microst. 46 (2009) 101
10. Meron T., and Markovich G. J. Phys. Chem. B 109 (2005) 20232
11. Alaria J., Turek P., Bernard M., Bouloudenine M., Berbadj A., Brihi N., Schmerber G., Colis S., and Dinia A. Chem. Phys. Lett. 415 (2005) 337
12. Matsukura F., Ohno H., Shen A., and Sugawara Y. Phys. Rev. B 57 (1998) R2037
13. Akai H. Phys. Rev. Lett. 81 (1998) 3002
14. von Baradeleben H.J., Cantin J.L., Chikoidze E., and Mauger A. J. Appl. Phys. 101 (2007) 013902
15. Masuko K., Ashida A., Yoshimura T., and Fujimura N. J. Appl. Phys. 103 (2008) 043714
16. Xu W., Zhou Y.X., Zhang X.Y., Chen D.L., Xie Y.N., Liu T., Yan W.S., and Wei S.Q. Solid State Commun. 141 (2007) 374
17. Kang J.-S., Han S.W., Park J.-G., Wi S.C., Lee S.S., Kim G., Song H.J., Shin H.J., Jo W., and Min B.I. Phys. Rev. B 71 (2005) 092405
18. Butorin S.M., Guo J.-H., Magnusson M., Kuiper P., and Nordgren J. Phys. Rev. B 54 (1996) 4405
19. Chang G.S., Kurmaev E.Z., Boukhvalov D.W., Finkelstein L.D., Colis S., Pedersen T., Moewes A., and Dinia A. J. Phys. Condens. Matter 19 (2007) 276210
20. Bouloudenin M., Vart N., Colis S., Kortus J., and Dinia A. Appl. Phys. Lett. 87 (2005) 052501
21. Oba F., Nishitani S.R., Isotani S., and Adachi H. J. Appl. Phys. 90 (2001) 824
22. Soler J.M., Artacho E., Gale G.D., Garsia A., Junquera J., Ordejon P., and Sanchez-Portal D. J. Phys. Condens. Matter 14 (2002) 2745
23. Andersen O.K. Phys. Rev. B 12 (1975) 3060
24. Alaria J., Bouloudenin M., Schmerber G., Colis S., and Dinia A. J. Appl. Phys. 99 (2006) 08M118
25. Chang G.S., Kurmaev E.Z., Boukhvalov D.W., Finkelstein L.D., Kim D.H., Noh T.-W., Moewes A., and Callcott T.A. J. Phys. Condens. Matter 18 (2006) 4243
26. Wang Q., Sang Q., Rao B.K., and Jena P. Phys. Rev. B 69 (2004) 233310
27. Zhao Y.-J., Shishidou T., and Freeman A.J. Phys. Rev. Lett. 90 (2003) 047204