Neural network metamodeling for cycle time-throughput profiles in manufacturing

European Journal of Operational Research

Volumn 205, Issue 1, 2010, Pages 172-185

  Yang, Feng ^a  

^a West Virginia University   (United States)

Author keywords

Design of experiments; Discrete event simulation; Neural networks; Queueing; Response surface modeling; Semiconductor manufacturing

Indexed keywords

BLACK BOXES; COMPREHENSIVE PERFORMANCE EVALUATION; CYCLE TIME; EFFICIENT ESTIMATION; EXPERIMENT DESIGN; MANUFACTURING SYSTEM; METAMODELING; METAMODELING METHODS; PERFORMANCE MEASURE; PRODUCT MANUFACTURING; PROGRESSIVE MODELS; RESPONSE SURFACE MODELING; SEMICONDUCTOR MANUFACTURING; SIMULATION DATA; TRADE-OFF RELATIONSHIP;

DESIGN OF EXPERIMENTS; DISCRETE EVENT SIMULATION; INDUSTRIAL APPLICATIONS; MANUFACTURE; SURFACE PROPERTIES;

NEURAL NETWORKS;

EID: 75849150509     PISSN: 03772217     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ejor.2009.12.026     Document Type: Article

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