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Volumn 81, Issue 1, 2010, Pages

An experiment for the investigation of forces on microparticles in ion beams

Author keywords

[No Author keywords available]

Indexed keywords

BROAD BEAMS; CHARGE-COUPLED DEVICE CAMERA; DIODE LASERS; ENERGETIC NEUTRAL ATOMS; HOLLOW GLASS; MICRO-PARTICLES;

EID: 75749132079     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3271536     Document Type: Review
Times cited : (14)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.